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6 Dec 2006: Thepresence of a RamanD peak at;1350 cm21 indicates thatthe s p2 phase is clustering into aromatic rings.18 There is arelationship23,24 between the in-plane correlation lengthL a ofthe ... 2.24 I (D)/I (G) is derived from the Raman spectra

13 Nov 2006: C2H2 60 nm/s 0.002 cc/Package/24 H 20. CH4 4 nm/s 0.030 cc/Package/24 H 1.3. ... C2H4 25 nm/s 0.012 cc/Pckage/24 H 3.3. a BIF: Barrier Improvement Factor is the ratio of a non-coated bottle to a.

8 Dec 2006: Our results differ considerably from those reported in [24]. c. e. ... 24] Pailard V., Melinon P., Perez J. P., Dupuis V., Perez A., Loubet J.

27 Nov 2006: The EPCs near K between bands [24] allow theaccurate determination of the intensity and shape of theRaman D peak. ... Jianget al., Chem. Phys. Lett. 392, 383 (2004). [24] For the branch near A01 at K, jg2Kk0q0;Kk0j2 hg2KiF1 cos'00.

13 Nov 2006: device operation.50 An optimized (pregrowth)catalyst nanostructuring, a lower C2H2 partial pressure,10,24. ... Small 2005, 1, 1180.(24) Lin, M.; YingTan, J. P.; Boothroyd, C.; Loh, K.

13 Nov 2006: and E by laser induced acoustic waves and/or by surfaceBrillouin scattering.22–24 Visible and UV Raman measure-ments were performed using Renishaw Ramanspectrometers.1,25 Table I summarizes the ... 374 412GLCH 2 24 0.248 379ta-C:H 2.2 30 250 0.77

23 Nov 2006: Rev. Mater. Res.24 83. [2] Duan X, Huang Y, Agarwal R and Lieber C M 2003 Nature421 241.

6 Dec 2006: decreases,E0 is measured at lower energies and no longer over a gap defects that could not be measured by ESR [ 24 ]. Robertson [ 25 ] demonstrated that it is possible to fit ... Robertson, Phys. Rev. B 53 (1996 ) 1594. [ 24 ] F.

13 Nov 2006: Peng et al. [24] reported a root. mean square (rms) roughness of 0.11 nm in a-C:H deposited. ... Technol. 174–175 (2003) 1135. [24] X.L. Peng, Z.H. Barber, T.W. Clyne, Surf.

22 Nov 2006: obtained here compared to previous films produced by the. small ECWR [24] can be explained by the relatively high. ... 24] A.C. Ferrari, J. Robertson, M.G. Beghi, C.E. Bottani, R. Ferulano, R.