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doi:10.1016/j.ijsolstr.2004.02.037
www-g.eng.cam.ac.uk/advancedstructures/files/pdf/galletly2004b.pdf27 Dec 2007: The vertical scale is. magnified 200 times compared with the horizontal scale. ... 280 30 38.5 40.0 39.6. 200 30 38.5 40.7 40.5. 120 32 38.7 42.7 43.0. -
doi:10.1016/j.ijsolstr.2004.02.036
www-g.eng.cam.ac.uk/advancedstructures/files/pdf/galletly2004a.pdf27 Dec 2007: 200 30 38.5 40.5. 120 32 38.7 43.0. 90 33 39.2 45.7. -
University scientists renew Christmas appeal | University of Cambridge
https://www.cam.ac.uk/news/university-scientists-renew-christmas-appeal21 Dec 2007: Over 200 million people in Africa and elsewhere are infected, and are at risk of serve organ damage and in some cases death. -
Conversations with Professor Peter Gonville Stein
https://www.squire.law.cam.ac.uk/sites/www.law.cam.ac.uk/files/images/www.squire.law.cam.ac.uk/legacy/Media/Eminent%20Scholars%20Archive%20Transcripts/stein%20transcript%203.pdf19 Dec 2007: 200. Do you think you improved with years – in other words, did practice make. -
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www-g.eng.cam.ac.uk/nms/publications/pdf/Pisana_JPCC2007.pdf18 Dec 2007: Experimental Methods. In situ TEM growth was carried out in a modified TecnaiF20, equipped with a differential pumping scheme (ETEM),operated at 200 kV.18 The microscope permits pressures of upto ... flow, in a LPCVD system at 200 mbar, bridging -
Thermal and chemical vapor deposition of Si nanowires:Shape control,…
www-g.eng.cam.ac.uk/nms/publications/pdf/Colli_JAP2007.pdf18 Dec 2007: Three-terminal FETs arefabricated by dispersing SiNWs on a 200-nm-thick SiO2layer thermally grown on a degenerate p-doped Si wafer,used as backgate. ... Here, the total pressure isconstant at 200 mTorr. At this pressure pure thermal growthis ineffective, -
Non-destructive Characterisation of Carbon Films Andrea C. Ferrari…
www-g.eng.cam.ac.uk/nms/publications/pdf/Ferrari_BOOK2008.pdf18 Dec 2007: Non-destructive Characterisation of Carbon Films. Andrea C. Ferrari. Abstract The availability of reliable characterisation tools for carbon films down to a few atomic layers’ thickness is one of the most decisive factors for technology -
Prestigious Indian honour for Cambridge scientist | University of…
https://www.cam.ac.uk/news/prestigious-indian-honour-for-cambridge-scientist13 Dec 2007: Last week the University hosted a dinner for more than 200 guests at Trinity College to celebrate those links and to honour His Excellency Kamalesh Sharma, a graduate of King's -
doi:10.1016/j.ijsolstr.2004.01.028
www-g.eng.cam.ac.uk/advancedstructures/files/pdf/kebadze2004.pdf12 Dec 2007: 0.05. 0.05. z (mm). -200 200 σx (N/mm2). (a). -0.05. 0.05. ... 200 200. z (mm). σy (N/mm2). (b). Fig. 16. Predicted stress distribution in test case 3, after forming. -
arX iv:0 711. 4533 v1 [ cond -mat .mtr ...
www-g.eng.cam.ac.uk/nms/publications/pdf/Scardaci_CM2007.pdf10 Dec 2007: Thus, the static and the dynamic models predict. 4. 0 100 200 300 400 500 600 700 800.
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