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1 - 10 of 1,039 search results for TALK:PC53 20 |u:www.doitpoms.ac.uk where 0 match all words and 1,039 match some words.

  1. Results that match 1 of 2 words

  2. Keyword

    https://www.doitpoms.ac.uk/miclib/keywords.php?id=24&page=4
    Reflected light microscopy. 20 μm. Showing 31 of 31 micrographs. Page4 | Previous | Next.

  3. System

    https://www.doitpoms.ac.uk/miclib/systems.php?id=24
    Focused ion beam (FIB) secondary electron image. 20 μm. CMOS integrated circuit with Al wiring.

  4. Browse the Library

    https://www.doitpoms.ac.uk/miclib/browse.php?cat=3&list=mic&page=5
    20 μm. Showing 41 - 50 of 51 micrographs. Page5is available on browsing.

  5. Advanced search

    https://www.doitpoms.ac.uk/miclib/advanced_search.php
    Whole words. Whole field. Any text. 10 results. 20 results. 30 results.

  6. Browse the Library

    https://www.doitpoms.ac.uk/miclib/browse.php?cat=18&sys=13&list=mic
    Scanning electron microscopy (SEM). 20 μm. HY100 forging steel, notched impact specimen, failed through brittle intergranular fracture.

  7. Browse the Library

    https://www.doitpoms.ac.uk/miclib/browse.php?cat=3&key=205&list=mic
    20 nm. Misoriented interphase boundary between h-BN (precipitate) and SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite).

  8. Full Record for Micrograph 429

    https://www.doitpoms.ac.uk/miclib/full_record.php?id=429
    Search. Dissemination of IT for the Promotion of Materials Science (DoITPoMS). Full Record for Micrograph 429. Full Record for Micrograph 429. [223 KB]. You can also view and download the micrographs on Flickr.. Micrograph no. 429. Brief

  9. Electromigration (all content)

    https://www.doitpoms.ac.uk/tlplib/electromigration/printall.php
    Rev. Mater. Sci. 20 p.229, 2000. Degradation at vias is dependent not only on composition and grain structure, but also on the direction of current flow. ... Metal. Electrical resistivity (at 20 ºC) / µΩ cm. Al. Cu. Au.

  10. Micrograph 617 and full record

    https://www.doitpoms.ac.uk/miclib/micrograph_record.php?id=617
    Composition. Co 70, Sm 10, Cu 20 (at%).

  11. Browse the Library

    https://www.doitpoms.ac.uk/miclib/browse.php?cat=2&sys=66&tec=11&list=mic
    Diamond. System: C, Composition: Carbon. Atomic force microscopy (AFM). 20 μm.

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