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11 Dec 2006: angle distortions. The volume of the new sp sites would2. be larger that the previous sp sites, which would create3. ... Appl. Phys. 82(1997). 6024.w38x D.L. Smith, Thin Film Deposition, McGraw-Hill, New York,.

12 Dec 2006: formeds p2 sites; resistivity is mostsensitive to the presence of news p2 sites even if they arenot clustering! ... PhLett. 71, 14301997! 32D. L. Smith, Thin Film DepositionMcGraw–Hill, New York, 1995!33L.

7 Jun 2006: Usually "Use" in the case of appliances: but new technology can increase the energy costs associated with production and manufacture. • ... Note that the slide indicating that the production of a new house is the dominant phase assumes a life time of

28 Nov 2006: Raman SpectroscopyWiley, New York, 2002!31A. C. Ferrari, S. Piscanec, S. Hofmann, M. ... Y. Yu and M. Cardona,Fundamentals of SemiconductorsSpringer,. New York, 1999!34M. Balkanski, R.

2 Jun 2006: new 160 MW Horns Rev wind farm off the west coast of Jutland. ... One wedge would require new forests over an area the size of the continental U.S.

4 Dec 2006: r. the breathing modes of all ringlikes p2 configurations. As faras we know, the presence of a residualD peak in UV Ramanspectra ofa-C’s is a new finding, which can ... The T peak and sp3 content. The first UV Raman studies of ta-C by Gilkeset al.29

27 Nov 2006: 8a.) The new generation of optical storage. 195A.C. Ferrari / Surface and Coatings Technology 180 – 181 (2004) 190–206. ... New technologies like NearField, super resolution and domain expansion will enable the nextjump of capacity to approximately

6 Dec 2006: M. LaffertyWiley,. New York, 1980!32M. M. M. Bilek, M. Chhowalla, and W.

13 Nov 2006: L.New, J. Appl. Phys. 84, 5277 1998. 50 C. Marechal, A. ... G. Fateley, and F. F. Bentley, CharacteristicRaman Frequencies of Organic Molecule Wiley, New York,.

4 Dec 2006: A new result from our UV Raman measurements is tall thes bonds become visible and we can now clearly detSi–C, Si–H, and C–H bonds. ... L. Harris and C. Y. W. YangSpringer, New York, 1989!, p.