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6 Jul 2005: The structures were formed using a through-mask-plating technology [24, 25]. Figure 4 shows the processflow. ... 24] Shenoy R V and Datta M 1996 Effect of mask wall angle onshape evolution during through-mask electrochemicalmicromachining J.

7 Jul 2005: 8c with32 000 nodes and 24 000 elements provides adequate accuracy (within 1% of the collapse response). ... Journal of the Institute of Metals 1970;. 98:215–24.[18] Ashby MF. Cost estimation for sandwich cores.

10 Feb 2005: the desire to properly capture shear bandsand other localized failure bands, as well as tocapture size effects that were observed in exper-iments [17–24]. ... Î = minu(x,ζ)Û. Ē[u] (24). Since the dependence of u(x, ζ) on ζ isknown, the energy

6 Jul 2005: θLθ0. [σt. 2 cos 2θ. sin 2θ0. ]dθ (24). and the energy balance can be written:.

15 Nov 2005: improve the precision; the second, to establish reproducibility. How to write a paper, 6th edition MFA, 20/02/05 24.

16 Dec 2005: 24 and 27. 4.3 Thermal Actuators and their MEMS Devices. Lateral thermal actuators, switches, and microtweezhave been fabricated and tested electrically. ... 23. S. D. Senturia,Microsystem Design, Chapter 9, Kluwer Academic,Boston/London2001! 24. J.

4 Aug 2005: Revised 24 March 1998. the Cosserat and Toupin—Mindlin theories were developed for linear elastic materials. ... 1and u. 2at each ‘mid-side’ node. The total number of degrees of freedom per element is 24.

6 Jul 2005: Received 24 January 2005, in final form 7 April 2005Published 20 June 2005Online at stacks.iop.org/JMM/15/S153. ... Typical examples of techniques hitherto employed for thistask are indentation tests [24], bending tests [25] and resonancetests [26].

6 Jul 2005: For example, Kyriakides et al. (1995). 24 N.A. Fleck, D. Liu. ... Then, the transition value of̄φ0 is in the range 14 to 24 (assumingγY = 0.01).

6 Jul 2005: The brief process can alsobe found in [24], but the detailed process and electrical testswill be reported in the future. ... Microelectromech. Syst. submitted. [24] Luo J K, Fu Y Q, Flewitt A J, Spearing S M, Fleck N A andMilne W I 2005 Large